18/08/2026Veri Anla Taelim Lee na wenzake walichunguza kwa majaribio jinsi kuunda gradient iliyodhibitiwa ya mkusanyiko wa alumini katika HfO₂-based metal–insulator–metal (MIM) capacitors, badala ya kuisambaza kwa usawa katika filamu yote, kunavyobadilisha dielectric performance. Tazama zaidi
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